HOLMARC’s Model HO-SP-3S300F is a CCD based scanning spectrometer, rapidly scan a range of wavelengths and record light intensity at each wavelength. In this spectrometer, only 70nm wavelength range is covered in a single imaging, by making use of the entire 3648 pixels available in the CCD. This feature increases the resolution significantly. For obtaining spectra over full wavelength range, various spectral images are taken and stitched together using the software provided. Hence this device is named “Stitched Scanning Spectrometer”. It works in the wavelength range of 200 to 1050nm.
Holographic diffraction grating used in this spectrometer disperses light by diffracting different wavelengths at different angles and it is subsequently focused by a second concave mirror. The grating is positioned in such a way to get all the wavelength of light in to a linear CCD. The required wavelength range is selected by rotating angle of the grating. The mirror and slit positions remain fixed. It utilizes a computer controlled motorized turret for automatic grating and wavelength selection. Resolution and wavelength range of the spectrometer is depends on the selection of grating.
Scanning is possible for a desired wavelength range. This feature saves time whenever full wavelength range scan is not necessary.
Electronics is packaged inside the housing and has RS-232 interface to the computer. For USB interface a Serial to USB converter is connected to the RS-232 output and a USB converter driver needs to be loaded on the computer so that it will recognize the USB interface as a virtual RS-232 serial port. There is also a fast and interactive graphical software interface allowing full control of all the spectrograph functions.
| Optical path configuration | : | Czerny-Turner type |
| Focal Length | : | 300 mm |
| Aperture Ratio | : | f / 6 |
| Port Configuration | : | Single I / P & O / P (Customizable) |
| Dispersion element | : | Holographic grating UV Optimized |
| Grating density | : | 1200 |
| Grating Size | : | 50 x 50 mm |
| Relative diffraction efficiency | : | 65 % |
| Wavelength range | : | 200 - 1050 nm |
| Resolution with CCD (FWHM) | : | ~ 0.058 nm |
| Band width per pixel | : | ~ 0.029 nm |
| Slit width | : | 0 - 3 mm, Micrometer controlled |
| Slit Resolution | : | 10 Micron |
| Dispersion | : | 2.459 nm / mm @ 350nm |
| CCD wavelength coverage | : | 70 nm |
| CCD Sensor | : | B / W line Sensor |
| Number of Pixels | : | 3648 |
| Pixel Size | : | 8 x 200 micron |
| Pixel Output Clock | : | 0.5 MHz |
| ADC resolution | : | 16 bits |
| Exposure Time Range | : | 0.1ms - 6,500ms |
| Frame Rate | : | Up to 138 scans / second |
| Interface | : | USB 2.0 |
| Compatibility | : | Windows 2000 XP or higher |
| Default slit width is 20 μm Spectral Coverage : approximate, use for reference purpose only |
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| High resolution spectral analysis |
| High wavelength accuracy |
| 200 - 1100nm spectral range in a single scan |
| Optional photomultiplier and silicon photo diode detector |
| Adjustable Input slit to control the spectral resolution |
| Selectable wavelength range |
| RS-232 and USB to serial port extension module |
| Optional optical port with optical output and detector input ports |
Heavy duty aluminium construction is used for stability with respect to vibration and thermal effects. Multiple accessory options allow the user to configure the system for custom applications. The basic system and accessories are designed in modular fashion. More and more accessories can be added as the applications expand.
It can be used for spectroscopic study of LED’s, optical filters, general emission and absorption experiments etc.
Dual exit port configured model is also available. It enables simultaneous mounting of different detectors. It helps to work with different wavelength region. The Software allows usage of all the functions of each device independently. All systems can be made completely automated and PCcontrolled.
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