The spectral responsivity or quantum efficiency (QE) is essential for understanding current generation, recombination, and diffusion mechanisms in photovoltaic devices. PV cell and module calibrations often require a spectral correction factor that uses the QE. The quantum efficiency in units of electron - hole pairs collected per incident photon is computed from the measured spectral response in units of amperes per watt as a function of wavelength. Model HO-SC-QE is integrated with 50W Tungsten Halogen lamp with housing, optics, power supply and an easy to use software with capability to measure the spectral response and quantum efficiency of solar cell at the wavelengths from 400nm to 1200nm.
System includes a sample stage, capable of accommodating samples up to 50 mm diameter and probes to contact the sample. Light is normally incident on the sample. Fixed frequency chopper and lock in amplifier are used for modulating the light at a frequency of 400Hz for measuring spectral response. Wavelength resolution of monochromator is 0.1nm. Illumination area can be adjusted using lens assembly system.
It can also be used for characterization / measurement of the imaging systems (cameras) and other detectors in terms of linearity range, spatial non-uniformity of response (the variation of responsivity across the active area of a detector) etc.
Parameters | SR (Spectral Response) |
EQE (External Quantum Efficiency) OR IPCE (Incident Photon to Current Efficiency) in both AC and DC | |
Spectral Reflectance | |
IQE (Internal Quantum Efficiency) | |
Wavelength range | 350 nm to 1500 nm |
Spot Size on the sample | Variable within 1 mm x 1 mm to 3 mm x 3 mm |
Shape of spot will be rectangular as per the design of instrument. | |
Light Sources | Single Quartz halogen lamp to cover the whole wavelength range |
Constant current power supply | |
Proper housing for light source will be provided | |
Monochromator | Czerny Turner Configuration |
Slit Size | Slit Height - should be as per optics requirement |
Slit Width - variable (at least 0.15 to 2.5 mm) | |
Bandwidth | 5 nm or better |
Grating | Dual grating turret |
600 lines / mm (Blazing wavelength : 1250nm) & 1200 lines / mm (Blazing wavelength : 500nm) gratings | |
Wavelength Accuracy | 0.5 nm or better |
Wavelength Scan Step size | 1 nm to 10nm adjustable using software |
Filters | Suitable combination of long pass and band pass filters to reject and allow light for high signal to noise ratio and to remove second order light peaks with multi position filter wheel will be provided. |
Selection, Switching and moving of grating, filters etc. will be auto control by software to cover entire measurement range | |
Optical Chopper with lock in amplifier | Optical chopper for AC measurement with control module will be provided |
Chopper Frequency : ( adjustable software ) from 20Hz to 200Hz | |
Arrest option for DC mode measurement (i.e. 0 Hz) | |
Optical sensor to provide feedback to the lock-in amplifier circuit | |
Reflectance Measurement Accessories |
Integrating Sphere for reflection measurement for whole measurement range |
Diameter of integrating sphere ≥ 4 inch | |
Integrating Sphere will have its separate calibrated detector for measurement in complete spectral range | |
Facility to insure the spot size on the same location of the sample as during the EQE measurement will be provided | |
Integrating sphere will be able to accommodate the sample of 1cm x 1cm to 5cm x 5cm such that probe beam (or light spot) can be placed at any selected location of the sample. Port reducer will be provided with integrating sphere as per requirement | |
Adjustable lens to vary the focal length of the beam, so that same focal length can be set at both EQE and reflectance measurements | |
Reference Detectors | Two photodiodes for calibration covering the whole measurement range |
Calibration values taken from the spectral response curves provided in the datasheets of the photodiodes | |
Reference Cell | Reference solar cell traceable to NREL calibration with EQE data for QE testing and calibration purpose |
Voltage bias capabilities for sample | Variable from -5V to +5V (selectable) for biasing the sample during the measurement will be provided with all proper connections and integration |
Step size or resolution of 0.1V | |
Sample Holder | Sample holder will be designed to accommodate and measure the rigid and flexible sample of size from 1cm x 1cm (or less) to 5cm x 5cm (or more) with thickness from 0.5mm to 3mm |
Sample holder will be designed to connect both the probes in front-front, front-back and backback; all the three contact configuration on the sample | |
Micro positioners with spring loaded hemispherical tips | At least 2 nos of magnetic based micro positioners (one for positive terminal and one for negative terminal) with precise X,Y,Z movement using nobs in all three directions will be provided with proper spring loaded hemispherical gold coated probe tips and cables to insure proper electrical connections with samples without damaging / penetrating it |
Tips / probes will be mounted properly at appropriate angle to insure the clear path for light beam. However the tilting angle will not be such that tip will slip on sample while placing or tightening | |
Length of tip holding rods and movement of X, Y micro positioner will be sufficient to cover the sample of 1cm x 1cm to 5cm x 5cm | |
Housing | Complete system including sample will be assembled in a dark light tight enclosure to facilitate all measurements (EQE, reflectance, IQE, SR) without the requirement of a dark room |
Power Requirement | Single phase, 230V, 50 Hz |
One 230V 5A wall socket is required for the device | |
Extension box will be provided, if required for multiple connections |
System is completely automatic with software controlled with need for minimum manual intervention for a user friendly operation for data collection, plotting and analysis |
The software also provide the flexibility and ease of use with full manual control over for monochromator, filters, gratings etc. for diagnostic purpose |
Selection of Light source, grating, filters etc. will be auto control by software to cover the whole wavelength range for measurement |
Software is capable of measuring, recording, storing and plotting the EQE, IQE, SR, reflectance data |
Software is capable of plotting multiple graphs together |
Software is compatible with windows 10 operating system |
Measurement range and step size of wavelength during the measurement will be user definable |
Data stored to disc can be directly examined within the supplied software and also can be exported to a text file readable by most third party software packages like MS-excel, Origin etc |
Licensed key of the software will be provided for lifetime |
External Quantum Efficiency
Internal Quantum Efficiency
Photosensitivity
Reflectance
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